ISSN 1286-0042 Semiconductors and Devices In-plane strain states of standard and flip-chip GaN epilayers Z. Y. Zuo, D. Liu, R. J. Wang, S. B. Qin, H. Liu and X. G. Xu The European Physical Journal Applied Physics / Volume 54 / Issue 01, 10101 Extraction of equivalent circuit parameters of solar cell: influence of temperature M. Khalis, Y. Mir, J. Hemine and M. Zazoui Thermal lensing study based ..